Reflective interferometry for optical metamaterial phase measurements.

نویسندگان

  • Kevin O'Brien
  • N D Lanzillotti-Kimura
  • Haim Suchowski
  • Boubacar Kante
  • Yongshik Park
  • Xiaobo Yin
  • Xiang Zhang
چکیده

The unambiguous determination of optical refractive indices of metamaterials is a challenging task for device applications and the study of new optical phenomena. We demonstrate here simple broadband phase measurements of metamaterials using spectrally and spatially resolved interferometry. We study the phase response of a π-shaped metamaterial known to be an analog to electromagnetically induced transparency. The measured broadband interferograms give the phase delay or advance produced by the metamaterial in a single measurement. The presented technique offers an effective way of characterizing optical metamaterials including nonlinear and gain-metamaterial systems.

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عنوان ژورنال:
  • Optics letters

دوره 37 19  شماره 

صفحات  -

تاریخ انتشار 2012